Study of focused-ion-beam–induced structural and compositional modifications in nanoscale bilayer systems by combined grazing incidence x ray reflectivity and fluorescence-Reference-Cited by-同舟云学术

Study of focused-ion-beam–induced structural and compositional modifications in nanoscale bilayer systems by combined grazing incidence x ray reflectivity and fluorescence

Published:2012-02-15 Issue:4 Volume:111 Page:044324
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Arac Erhan,Burn David M.,Eastwood David S.,Hase Thomas P. A.,Atkinson Del

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3689016

Reference60 articles.

1. Magnetic domain-wall dynamics in a submicrometre ferromagnetic structure

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5. Focused ion-beam patterning of nanoscale ferroelectric capacitors

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