Influence of N-type μc-SiOx:H intermediate reflector and top cell material properties on the electrical performance of “micromorph” tandem solar cells-Reference-Cited by-同舟云学术

Influence of N-type μc-SiOx:H intermediate reflector and top cell material properties on the electrical performance of “micromorph” tandem solar cells

Published:2018-01 Issue:1 Volume:8 Page:015115
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Chatterjee P.¹,Roca i Cabarrocas P.¹^ORCID

Affiliation:

1. Laboratoire de Physique des Interfaces et des Couches Minces, CNRS, Ecole Polytechnique, Université Paris-Saclay, 91128 Palaiseau, France

Funder

European Commission

Ministry of New and Renewable Energy India

Department of Science and Technology, Ministry of Science and Technology

Council of Scientific and Industrial Research

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5005114

Reference35 articles.

1. J. Meier, S. Dubail, R. Flückiger, D. Fischer, H. Keppner, and A. Shah, Proceedings of the First World Conf. on Photovoltaic Energy Conversion, Hawaii, USA, p. 409, 1994.

2. Towards high-efficiency thin-film silicon solar cells with the “micromorph” concept

3. Optical management in high-efficiency thin-film silicon micromorph solar cells with a silicon oxide based intermediate reflector

4. High-Stable-Efficiency Tandem Thin-Film Silicon Solar Cell With Low-Refractive-Index Silicon-Oxide Interlayer

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