Surface analysis of field‐ion samples exposed to the plasma of the impurities studies experiment (ISX‐A) tokamak
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.91058
Reference4 articles.
1. Imaging atom-probe mass spectroscopy
2. Deuterium depth profiles in metals using imaging field desorption
3. Depth profiling a near surface carbon contaminant in implanted first wall materials
4. Reaction of thermal atomic hydrogen with carbon
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Atom probe field-ion microscopy: A technique for microstructural characterization of irradiated materials on the atomic scale;Metallurgical Transactions A;1989-12
2. A direct observation of the trapping of deuterium ions at a grain boundary in tungsten;Applied Physics Letters;1980-10
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