An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4848995
Reference15 articles.
1. P. J. Burke and C. Rutherglen, in Conference on Precision Electromagnatics Measurements Digest (IEEE, 2008), pp. 494–495.
2. Gigahertz characterization of a single carbon nanotube
3. Surface resistance imaging with a scanning near-field microwave microscope
4. Nanometer-scale material contrast imaging with a near-field microwave microscope
5. Scanning Near-Field Microwave Microscopy of VO2and Chemical Vapor Deposition Graphene
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