Nanometer-scale material contrast imaging with a near-field microwave microscope-Reference-Cited by-同舟云学术

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Nanometer-scale material contrast imaging with a near-field microwave microscope

Published:2007-04-02 Issue:14 Volume:90 Page:143106
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Imtiaz Atif,Anlage Steven M.,Barry John D.,Melngailis John

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2719164

Reference16 articles.

1. High-frequency near-field microscopy

2. Ultra-shallow-doped film requirements for future technologies

3. Principles of Near-Field Microwave Microscopy

4. A near-field scanned microwave probe for spatially localized electrical metrology

5. Surface resistance imaging with a scanning near-field microwave microscope

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1. Near-Field Microwave Microscopy for 3D Surface Assessment of Manufactured Structures;IEEE Journal of Microwaves;2023-07

2. Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy;AIP Advances;2021-03-01

3. Recent development of microwave applications for concrete treatment;Construction and Building Materials;2021-02

4. Introducción a la microscopía y nanoscopía a frecuencias GHz y THz;Mundo Nano. Revista Interdisciplinaria en Nanociencias y Nanotecnología;2019-12-03

5. Super resolution in depth for microwave imaging;Applied Physics Letters;2019-07-22

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