Terahertz microscopy of charge carriers in semiconductors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2186743
Reference13 articles.
1. Measurements with a noninvasive detector and dephasing mechanism
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4. Optical and electronic properties of doped silicon from 0.1 to 2 THz
5. Real‐time electron cyclotron oscillations observed by terahertz techniques in semiconductor heterostructures
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