Focused ion beam direct deposition of superconductive thin film-Reference-Cited by-同舟云学术

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Focused ion beam direct deposition of superconductive thin film

Published:1994-12-19 Issue:25 Volume:65 Page:3278-3280
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Nagamachi Shinji,Yamakage Yasuhiro,Ueda Masahiro,Maruno Hiromasa,Shinada Kei,Fujiyama Yoichi,Asari Masatoshi,Ishikawa Junzo

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.112436

Reference6 articles.

1. Focused ion beam direct deposition of gold

2. Focused Ion Beam Induced Deposition

3. Effect of Dissolved Gases on Some Superconducting Properties of Niobium

4. Impregnated‐electrode‐type liquid metal ion source

5. Superconductivity of Niobium Films

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1. Molecular dynamics simulation for focused ion beam processing: a comparison between computational domain and potential energy;Journal of Physics: Conference Series;2008-03-01

2. Electrospray droplet sources for thin film deposition;Journal of Materials Science;2006-11-28

3. TEM investigation of FIB induced damages in preparation of metal material TEM specimens by FIB;Materials Letters;2006-01

4. Focused ion beam induced deposition of superconducting thin films;Physica C: Superconductivity and its Applications;2005-10

5. Characterization of focused ion beam induced deposition process and parameters calibration;Sensors and Actuators A: Physical;2001-01

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