TEM investigation of FIB induced damages in preparation of metal material TEM specimens by FIB
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference15 articles.
1. Layer structure evaluation of multilayer x-ray mirror by combination of focused ion beam etching and transmission electron microscopy
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5. Grain Delamination of Ag-Doped YBa2Cu3O7-xSuperconductor
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