Metalorganic chemical vapor deposition of aluminum oxide on Si: Evidence of interface SiO2 formation
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1483903
Reference27 articles.
1. High-κ gate dielectrics: Current status and materials properties considerations
2. High-quality aluminum oxide gate dielectrics by ultra-high-vacuum reactive atomic-beam deposition
3. Properties of alumina films prepared by low-pressure metal-organic chemical vapour deposition
4. High-resolution depth profiling in ultrathin Al2O3 films on Si
5. Evidence of aluminum silicate formation during chemical vapor deposition of amorphous Al2O3 thin films on Si(100)
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