Time‐dependent breakdown of silicon dioxide films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1654726
Reference7 articles.
1. Ion Neutralization Processes at Insulator Surfaces and Consequent Impurity Migration Effects in SiO2Films
2. The maximum dielectric strength of thin silicon oxide films
3. Ion Transport Phenomena in Insulating Films
4. Fowler‐Nordheim Tunneling into Thermally Grown SiO2
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