Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy-Reference-Cited by-同舟云学术

Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

Published:2016-06-20 Issue:25 Volume:108 Page:252902
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Yang Sang Mo¹^ORCID,Mazet Lucie²,Okatan M. Baris¹,Jesse Stephen¹,Niu Gang³,Schroeder Thomas³,Schamm-Chardon Sylvie⁴^ORCID,Dubourdieu Catherine²,Baddorf Arthur P.¹,Kalinin Sergei V.¹^ORCID

Affiliation:

1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

2. Institut des Nanotechnologies de Lyon, CNRS UMR 5270, Ecole Centrale de Lyon, Université de Lyon, 69134 Ecully, France

3. IHP—Innovations for High Performance Microelectronics, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany

4. CEMES-CNRS, Université de Toulouse, 29 rue Jeanne Marvig, F-31055 Toulouse, France

Funder

DOE Office of Science User Facility

French National Research Agency

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4954276

Reference20 articles.

1. Nanoscale ferroelectrics: processing, characterization and future trends

2. Local polarization dynamics in ferroelectric materials

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4. Nanoscale polarization manipulation and imaging of ferroelectric Langmuir-Blodgett polymer films

5. Restricted domain growth and polarization reversal kinetics in ferroelectric polymer thin films

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