Hot-carrier effects in p-channel polycrystalline silicon thin film transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2378587
Reference13 articles.
1. Gate Length Dependence of Hot Carrier Reliability in Low-Temperature Polycrystalline-Silicon P-Channel Thin Film Transistors
2. Submicron transferred-substrate heterojunction bipolar transistors
3. Stable Polycrystalline Silicon TFT With MICC
4. Hot-carrier-induced degradation of threshold voltage in p-channel low-temperature poly-Si TFTs
5. Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors
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3. Abnormal Output Characteristics of p-Type Low Temperature Polycrystalline Silicon Thin Film Transistor Fabricated on Polyimide Substrate;IEEE Journal of the Electron Devices Society;2016-01
4. Edge Effects in Self-Heating-Related Instabilities in p-Channel Polycrystalline-Silicon Thin-Film Transistors;IEEE Electron Device Letters;2011-12
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