Performance and reliability enhancement of flexible low-temperature polycrystalline silicon thin-film transistors via activation-annealing temperature optimization-Reference-Cited by-同舟云学术

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Performance and reliability enhancement of flexible low-temperature polycrystalline silicon thin-film transistors via activation-annealing temperature optimization

Published:2023-09 Issue: Volume:780 Page:139925
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Kim Youngrok,Kim Dongbhin,Ryu Jinha,Shin Jaewoo,Lee Saemi,Choi Byoungdeog

Funder

National Research Foundation of Korea

Ministry of Science, ICT and Future Planning

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Mini-LED, Micro-LED and OLED displays: present status and future perspectives;Huang;Light: Sci. Applica.,2020

2. Flexible and stretchable smart display: materials, fabrication, device design, and system integration;Koo;Adv. Funct. Mater.,2018

3. 59.1: invited paper: LTPS backplane technologies for AMLCDs and AMOLEDs;Kim,2011

4. Investigation on anomalous leakage currents in poly-TFTs including dynamic effects;Colalongo;IEEE Trans. Electron. Dev.,1997

5. A physical model for grain-boundary-induced threshold voltage variation in polysilicon thin-film transistors;Ho;IEEE Trans. Electron. Dev.,2012

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