A method to numerically determine the secondary electron yield considering effects of the surface morphology
Author:
Affiliation:
1. State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, Shaanxi 710049, China
2. Ecole Polytechnique Fédérale de Lausanne (EPFL), Swiss Plasma Center (SPC), CH-1015 Lausanne, Switzerland
Funder
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0055542
Reference41 articles.
1. Secondary Electron Emission of Pt: Experimental Study and Comparison With Models in the Multipactor Energy Range
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