Statistical nature of secondary electron emission-Reference-Cited by-同舟云学术

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Statistical nature of secondary electron emission

Published:2023-03 Issue: Volume:536 Page:119-125
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Newson D.M.^ORCID,Kadokura R.,Brawley S.J.^ORCID,Shipman M.,Laricchia G.^ORCID

Funder

Engineering and Physical Sciences Research Council

University College London

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference34 articles.

1. Secondary electron emission in the scanning electron microscope;Seiler;J. Appl. Phys.,1983

2. B. Baglin, J. Bojko, O. Grobner, B. Henrist, N. Hilleret, C. Scheuerlein, M. Taborelli, The Secondary Electron Yield of Technical Materials and its Variation with Surface Treatments, in: Conference: EPAC 2000 : 7th European Particle Accelerator Conference, 2000, p. 217.

3. In-situ measurements of the secondary electron yield in an accelerator environment: Instrumentation and methods;Hartung;Nucl. Instrum. Methods A,2015

4. On secondary electron emission and its semi-empirical description;Tolias;Plasma Phys. Control. Fusion,2014

5. Fundamentals of Spacecraft Charging: Spacecraft Interactions with Space Plasmas;Lai,2012

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