Exact determination of superlattice structures by small‐angle x‐ray diffraction method
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.99342
Reference9 articles.
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4. X‐ray diffraction study of interdiffusion and growth in (GaAs)n(AlAs)mmultilayers
5. Optical and structural properties of molecular-beam epitaxially grown Ga0.47In0.53As/Al0.48In0.52As superlattices, emitting at 1.55 ?m at room temperature
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