Understanding the effect of confinement in scanning spreading resistance microscopy measurements-Reference-Cited by-同舟云学术

Understanding the effect of confinement in scanning spreading resistance microscopy measurements

Author:

Pandey Komal¹²^ORCID,Paredis Kristof¹^ORCID,Robson Alexander J.³⁴^ORCID,Vandervorst Wilfried¹²^ORCID

Affiliation:

1. Imec, Kapeldreef 75, 3001 Leuven, Belgium

2. Quantum Solid State Physics, KU Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium

3. Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom

4. Lancaster Material Analysis, Lancaster University, Lancaster LA1 4YB, United Kingdom

Funder

imec's industrial affiliation program

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

Reference31 articles.

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