Submicron nickel deposition on silicon from an electrolytic solution controlled by near-field optics
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1405136
Reference13 articles.
1. Modification of hydrogen‐passivated silicon by a scanning tunneling microscope operating in air
2. Selective area oxidation of silicon with a scanning force microscope
3. Fabrication of Si nanostructures with an atomic force microscope
4. Optical near‐field lithography on hydrogen‐passivated silicon surfaces
5. Scanning Electrochemical Microscopy: The Application of the Feedback Mode for High Resolution Copper Etching
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