Recent Developments in Tip-Based Nanofabrication and Its Roadmap

Abstract

Recent developments of tip-based nanofabrication (TBN) are reviewed. In TBN, a functionalized cantilevered-tip is the common basic apparatus for performing the tasks of nanofabrication. The nanofabrication applications of three major techniques under the TBN family: atomic force microscopy (AFM), dip-pen nanolithography (DPN), and scanning near-field optical microscopy (SNOM), are studied with the focus on their manipulability over the size, orientation, and position of the nanostructures fabricated. The nanostructures made by these techniques are selectively presented in order to illustrate the versatility and advancement of these tip-based techniques. The information reviewed and illustrated is extrapolated to form the basis for the assessment of the needs and challenges facing the TBN community in the future. A preliminary roadmap over the next seven years is then developed. The prospective approaches and focusing areas for future research and development are also discussed.