Three-dimensional characterization of tightly focused fields for various polarization incident beams-Reference-Cited by-同舟云学术

Three-dimensional characterization of tightly focused fields for various polarization incident beams

Published:2017-06 Issue:6 Volume:88 Page:063106
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Cai Yanan¹²,Liang Yansheng¹²,Lei Ming¹,Yan Shaohui¹,Wang Zhaojun¹²,Yu Xianghua¹,Li Manman¹²,Dan Dan¹,Qian Jia¹²,Yao Baoli¹

Affiliation:

1. State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China

2. University of Chinese Academy of Sciences, Beijing 100049, China

Funder

National Natural Science Foundation of China (NSFC)

Natural Science Foundation of Shaanxi Province (Shaanxi Province Natural Science Foundation)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4989519

Reference25 articles.

1. Optimization of depletion focal spot in STED nanoscopy using amplitude manipulation

2. Propagation of sharply autofocused ring Airy Gaussian vortex beams

3. Deconvolution methods for 3-D fluorescence microscopy images

4. Electromagnetic diffraction in optical systems - I. An integral representation of the image field

5. Electromagnetic diffraction in optical systems, II. Structure of the image field in an aplanatic system

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