A combination of ion beam sputtering and <i>in situ</i> x-ray diffraction as a method for depth-resolved phase analysis using nitrogen-implanted austenitic stainless steel as an example-Reference-Cited by-同舟云学术

A combination of ion beam sputtering and in situ x-ray diffraction as a method for depth-resolved phase analysis using nitrogen-implanted austenitic stainless steel as an example

Published:2022-01-14 Issue:2 Volume:131 Page:025306
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Manova Darina¹^ORCID,Schlenz Patrick¹,Mändl Stephan¹

Affiliation:

1. Leibniz Institute of Surface Engineering (IOM), Permoserstraße 15, 04318 Leipzig, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0075245

Reference54 articles.

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5. Review Article: Stress in thin films and coatings: Current status, challenges, and prospects

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