Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3630031
Reference15 articles.
1. Photoluminescence imaging of silicon wafers
2. Photoconductance-calibrated photoluminescence lifetime imaging of crystalline silicon
3. Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
4. Determination of the effective diffusion length of silicon solar cells from photoluminescence
5. Imaging interstitial iron concentrations in boron-doped crystalline silicon using photoluminescence
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