Photoconductance-calibrated photoluminescence lifetime imaging of crystalline silicon-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Photoconductance-calibrated photoluminescence lifetime imaging of crystalline silicon

Published:2008-09-12 Issue:6 Volume:2 Page:245-247
ISSN:1862-6254
Container-title:physica status solidi (RRL) - Rapid Research Letters
language:en
Short-container-title:phys. stat. sol. (RRL)

Author:

Herlufsen Sandra,Schmidt Jan,Hinken David,Bothe Karsten,Brendel Rolf

Funder

German State of Lower Saxony

German Federal Ministry for the Environment, Nature Conservation, and Nuclear Safety

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssr.200802192/fullpdf

Reference12 articles.

1. Photoluminescence imaging of silicon wafers

2. Photoluminescence Imaging of Multicrystalline Si Wafers during HF Etching

3. Application of photoluminescence characterization to the development and manufacturing of high-efficiency silicon solar cells

4. Trapping of minority carriers in multicrystalline silicon

5. Oxygen-related minority-carrier trapping centers in p-type Czochralski silicon

Cited by 92 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photoluminescence Spectroscopy Sheds New Light on Silicon Microchip Functional Properties;ACS Omega;2024-07-23

2. Temperature‐Dependent Lifetime and Photoluminescence Measurements;Photovoltaic Solar Energy;2024-06-21

3. Plasma‐Enhanced Chemical‐Vapor‐Deposited SiO_x(N_y)/n‐type Polysilicon‐on‐Oxide‐Passivating Contacts in Industrial Back‐Contact Si Solar Cells;Solar RRL;2024-06

4. Investigation of degradation characteristics of electron irradiated GaInP/InGaAs/Ge solar cell by numerical simulation model;International Journal of Energy Research;2022-05-27

5. Fast Wafer-Level Characterization of Silicon Photodetectors by Photoluminescence Imaging;IEEE Transactions on Electron Devices;2022-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3