High-resolution diffuse x-ray scattering from threading dislocations in heteroepitaxial layers

Author:

Daniš S.,Holý V.,Zhong Z.,Bauer G.,Ambacher O.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Defect structure of high-resistance CdTe:Cl single crystals and MoOx/CdTe:Cl/MoOx heterostructures according to the data of high-resolution X-ray diffractometry;Semiconductor Physics, Quantum Electronics and Optoelectronics;2023-12-05

2. X-ray investigations of structure of thick YIG epitaxial systems of different growth parameters;Fifteenth International Conference on Correlation Optics;2021-12-21

3. Defect and magnetic structure of Y2.93La0.07Fe5O12/Gd3Ga5O12 epitaxial systems;Fourteenth International Conference on Correlation Optics;2020-02-06

4. Study of Dislocation Densities of Thick GaN Films;Advanced Materials Research;2014-07

5. The point defect structure and its transformation in As-implanted ZnO crystals;Journal of Physics D: Applied Physics;2012-02-10

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