Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4919766
Reference18 articles.
1. Electronic transport at semiconductor surfaces––from point-contact transistor to micro-four-point probes
2. The formation of Si(111)5 × 2–Au single-domain surface phase by a surface diffusion
3. Electronic transport of Au-adsorbedSi(111)−3×3-Ag: Metallic conduction and localization
4. Metallic Transport in a Monatomic Layer of In on a Silicon Surface
5. Anisotropic conductivity of the Si(111)4×1-In surface: Transport mechanism determined by the temperature dependence
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