Abstract
Abstract
A reduction of the interprobe distance in multiprobe and double-tip scanning tunneling microscopy to the nanometer scale has been a longstanding and technically difficult challenge. Recent multiprobe systems have allowed for significant progress by achieving distances of ~30 nm using two individually driven, traditional metal wire tips. For situations where simple alignment and fixed separation can be advantageous, we present the fabrication of on-chip double-tip devices that incorporate two mechanically fixed gold tips with a tip separation of only 35 nm. We utilize the excellent mechanical, insulating and dielectric properties of high-quality SiN as a base material to realize easy-to-implement, lithographically defined and mechanically stable tips. With their large contact pads and adjustable footprint, these novel tips can be easily integrated with most existing commercial combined STM/AFM systems.
Funder
Nederlandse Organisatie voor Wetenschappelijk Onderzoek
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Materials Science (miscellaneous),Atomic and Molecular Physics, and Optics
Reference40 articles.
1. Thamankar, R., Yap, T., Goh, K., Troadec, C. & Joachim, C. Low temperature nanoscale electronic transport on the MoS2 surface. Appl. Phys. Lett. 103, 083106 (2013).
2. Jaschinsky, P., Wensorra, J., Lepsa, M. I., Myslivečcek, J. & Voigtländer, B. Nanoscale charge transport measurements using a double-tip scanning tunneling microscope. J. Appl. Phys. 104, 094307 (2008).
3. Hasegawa, S., Yoshimoto, S., & Hobara, R. Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV, Vol. 6800 (International Society for Optics and Photonics, 2008) p. 68000G.
4. Niu, Q., Chang, M. C. & Shih, C. K. Double-tip scanning tunneling microscope for surface analysis. Phys. Rev. B 51, 5502–5505 (1995).
5. Byers, J. M. & Flatté, M. E. Probing spatial correlations with nanoscale two-contact tunneling. Phys. Rev. Lett. 74, 306–309 (1995).
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