Capacitance Energy Level Spectroscopy of Deep‐Lying Semiconductor Impurities Using Schottky Barriers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1659102
Reference13 articles.
1. Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier System
2. Frequency dependence of the reverse-biased capacitance of gold-doped silicon P+N step junctions
3. Effects of deep impurities on n+p junction reverse-biased small-signal capacitance
4. Capacitance of Junctions on Gold‐Doped Silicon
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