Centimeter scale atomic force microscope imaging and lithography
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.122263
Reference10 articles.
1. On Some Modern Uses of the Electron in Logic and Memory
2. Low‐stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope
3. 6-MHz 2-N/m piezoresistive atomic-force microscope cantilevers with INCISIVE tips
4. Sequential position readout from arrays of micromechanical cantilever sensors
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