A novel fault diagnostic method for analog circuits using frequency response features
Author:
Affiliation:
1. School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin 150080, China
2. China Institute of Marine Technology and Economy, Beijing 100081, China
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5120560
Reference33 articles.
1. RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits
2. A Method for Local Parametric Fault Diagnosis of a Broad Class of Analog Integrated Circuits
3. Fault detection for linear analog IC-the method of short-circuit admittance parameters
4. A linear ridgelet network approach for fault diagnosis of analog circuit
5. One-class classifier based on SBT for analog circuit fault diagnosis
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