Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography-Reference-Cited by-同舟云学术

Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

Published:2019-02 Issue:2 Volume:9 Page:025105
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Chintala Ravi Chandra¹²³,Wood Sebastian³^ORCID,Blakesley James C.³,Favia Paola¹,Celano Umberto¹^ORCID,Paredis Kristof¹,Vandervorst Wilfried¹²,Castro Fernando A.³^ORCID

Affiliation:

1. IMEC, Kapeldreef 75, B-3001 Leuven, Belgium

2. Instituut voor Kern- en Stralingsfysica, (IKS), Celestijnenlaan 200D, B-3001 Leuven, Belgium

3. National Physical Laboratory, Teddington, Middlesex TW11 0LW, United Kingdom

Funder

EMPIR

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5066458

Reference45 articles.

1. Imaging modes of atomic force microscopy for application in molecular and cell biology

2. Organic photovoltaics: principles and techniques for nanometre scale characterization

4. Review: Recent Advances and Current Challenges in Scanning Probe Microscopy of Biomolecular Surfaces and Interfaces

5. Multimodal scanning probe imaging: nanoscale chemical analysis from biology to renewable energy

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