On the exact analytical solution of some families of equilibrium critical thickness transcendental equations-Reference-Cited by-同舟云学术

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On the exact analytical solution of some families of equilibrium critical thickness transcendental equations

Published:2014-11 Issue:11 Volume:4 Page:117124
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Perovich Slavica M.¹²,Calasan Martin P.¹,Toskovic Ranko³

Affiliation:

1. Department of Electrical Engineering, University of Montenegro, Podgorica, 81000, Montenegro

2. Faculty of Maritime Studies, University of Montenegro, Kotor, 81000, Montenegro

3. Department of Quantum Nanoscience, Delft University of Technology, Delft, 2600 Netherlands

Funder

Ministry of Science Montenegro

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://scitation.aip.org/deliver/fulltext/aip/journal/adva/4/11/1.4902161.pdf?itemId=/content/aip/journal/adva/4/11/10.1063/1.4902161&mimeType=pdf&containerItemId=content/aip/journal/adva

Reference27 articles.

1. Solution for the critical thickness models of dislocation generation in epitaxial thin films using the Lambert W function

2. One-dimensional dislocations. I. Static theory

3. Defects in epitaxial multilayers

4. The Stability of a Dislocation Threading a Strained Layer on a Substrate

5. Critical thickness in the HgCdTe/CdZnTe system

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