Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors-Reference-Cited by-同舟云学术

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Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors

Published:2021-02-01 Issue:2 Volume:9 Page:021113
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

Do M. T.¹²,Gauquelin N.³^ORCID,Nguyen M. D.¹^ORCID,Blom F.⁴,Verbeeck J.³^ORCID,Koster G.¹^ORCID,Houwman E. P.¹^ORCID,Rijnders G.¹^ORCID

Affiliation:

1. MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands

2. Hanoi National University of Education, 136 Xuan Thuy, Cau Giay, Hanoi, Vietnam

3. Electron Microscopy for Materials Science, University of Antwerp, 2020 Antwerp, Belgium

4. Canon Production Printing Netherlands, P.O. Box 101, 5900 MA Venlo, The Netherlands

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0038719

Reference28 articles.

1. Ferroelectric Memories

2. The Physics of Ferroelectric Memories

3. Ferroelectric thin films for micro-sensors and actuators: a review

4. Heterogeneity of fatigue in bulk lead zirconate titanate

5. Bipolar Fatigue Caused by Field Screening in Pb(Zr,Ti)O3Ceramics

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Increased fatigue resistance in transparent lead zirconate titanate thin films with interdigitated electrodes;Journal of the European Ceramic Society;2023-06

2. Evolution of the Ferroelectric Properties of AlScN Film by Electrical Cycling with an Inhomogeneous Field Distribution;Advanced Electronic Materials;2023-03-02

3. Enhancing the Energy‐Storage Density and Breakdown Strength in PbZrO ₃ /Pb _0.9 La _0.1 Zr _0.52 Ti _0.48 O ₃ ‐Derived Antiferroelectric/Relaxor‐Ferroelectric Multilayers;Advanced Energy Materials;2022-06-19

4. Thickness-dependent dielectric and ferroelectric properties of 0.7Bi(Fe0.98Mn0.02)O3-0.3PbTiO3 thin films on stainless steel substrates;Journal of Materials Science: Materials in Electronics;2022-05-17

5. Interface-induced effects on the polarization response of epitaxial ferroelectric thin films—an experimental study and theoretical analysis;Epitaxial Growth of Complex Metal Oxides;2022

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