A new method to do time‐resolved, x‐ray diffraction studies: The rotating crystal Laue method-Reference-Cited by-同舟云学术

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A new method to do time‐resolved, x‐ray diffraction studies: The rotating crystal Laue method

Published:1992-01 Issue:1 Volume:63 Page:1032-1034
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Knapp G. S.,Beno M. A.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1143191

Reference10 articles.

1. Time-resolved x-ray scattering study of ordering kinetics inSbCl5-intercalated graphite

2. Synchrotron X-Ray Diffraction Study of Silicon during Pulsed-Laser Annealing

3. Time‐resolved x‐ray study of Ge during pulsed laser melting

4. Time‐resolved x‐ray measurement system for studying the lattice deformation of semiconductor crystals under laser irradiation

5. Energy-dispersive spectroscopic methods applied to X-ray diffraction in single crystals

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1. Crystallographic Data Collection Using a Multilayer Monochromator on an Undulator Beamline at the Shanghai Synchrotron Radiation Facility;Crystals;2024-02-19

2. Kultur, Management und Organisation: Wirklichkeiten des interkulturellen Managements im Lichte von System-Umwelt-Differenzen;Episoden des interkulturellen Managements;1998

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