Conducting atomic force microscopy for nanoscale tunnel barrier characterization
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1777388
Reference18 articles.
1. Conducting atomic force microscopy study of silicon dioxide breakdown
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3. Formation of aluminum oxide thin films on FeAl() studied by STM
4. Ultrathin Aluminum Oxide Tunnel Barriers
5. Direct imaging of SiO2 thickness variation on Si using modified atomic force microscope
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