New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms-Reference-Cited by-同舟云学术

New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms

Published:2000-07 Issue:7 Volume:71 Page:2677-2683
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Xia Guo-Qiang,Zhang Rong-Jun,Chen Yu-Li,Zhao Hai-Bing,Wang Song-You,Zhou Shi-Ming,Zheng Yu-Xiang,Yang Yue-Mei,Chen Liang-Yao,Chu Jun-Hao,Wang Zhi-Ming

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1150674

Reference21 articles.

1. Fourier transform detection system for rotating-analyzer ellipsometers

2. High Precision Scanning Ellipsometer

3. Ellipsometric studies of electronic interband transitions inCdxHg1−xTe

4. Single-element rotating-polarizer ellipsometer: PSI meter

5. Improved measurement method in rotating-analyzer ellipsometry

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