Improved measurement method in rotating-analyzer ellipsometry
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Recent developments in instrumentation in ellipsometry
2. Azimuthal Misalignment and Surface Anisotropy as Sources of Error in Ellipsometry
3. Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometers
4. High Precision Scanning Ellipsometer
5. A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices
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1. Angular interferometer using calcite prism and rotating analyzer;Optics Communications;2007-09
2. Modified transmission type four detectors polarimeter;P SOC PHOTO-OPT INS;2004
3. New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms;Review of Scientific Instruments;2000-07
4. A three-intensity technique for polarizer-sample-analyser photometric ellipsometry and polarimetry;Journal of Physics D: Applied Physics;1998-08-21
5. Calibration method of the specific characteristic of an electronic system of a rotating-analyzer ellipsometer;Applied Optics;1997-04-01
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