Detection efficiency of a channel electron multiplier for low energy incident noble gas ions-Reference-Cited by-同舟云学术

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Detection efficiency of a channel electron multiplier for low energy incident noble gas ions

Published:2000-07 Issue:7 Volume:71 Page:2704-2709
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Tassotto M.,Watson P. R.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1150678

Reference18 articles.

1. Scattering and Recoiling Spectrometry: An Ion's Eye View of Surface Structure

2. Time‐of‐flight scattering and recoiling spectrometry

3. Direct recoil spectrometry

4. Amplification factors of a particle multiplier for multiply charged noble gas ions

5. Secondary electron emission induced by 5–30‐keV monatomic ions striking thin oxide films

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Efficiency of detection of Cs+ and Cl− ions with a ВЭУ-7-2 microchannel electron multiplier;Instruments and Experimental Techniques;2008-07

2. Channel electron multiplier and channelplate efficiencies for detecting positive ions;Review of Scientific Instruments;2005-09

3. Scattering and recoiling mapping of the Kr–Pt(111) system by SARIS;Surface Science;2003-08

4. A correction factor to the screening radius for atomic interactions involving hydrogen and its application in direct recoil spectrometry;Surface Science;2001-05

5. Molecular composition and orientation at the surface of room-temperature ionic liquids: Effect of molecular structure;Physical Chemistry Chemical Physics;2001

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