Use of biaxially oriented polypropylene film for evaluating and cleaning contaminated atomic force microscopy probe tips: An application to blind tip reconstruction
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1510554
Reference30 articles.
1. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
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1. Experimental methods in chemical engineering: Atomic force microscopy − AFM;The Canadian Journal of Chemical Engineering;2022-05-18
2. Tip wear and tip breakage in high-speed atomic force microscopes;Ultramicroscopy;2019-06
3. In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy;Beilstein Journal of Nanotechnology;2018-11-23
4. Artifacts and Practical Issues in Atomic Force Microscopy;Methods in Molecular Biology;2018-10-30
5. Cleaning of contaminated MFM probes using a BOPP film and external magnetic field;Micron;2017-06
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