A study of the chemical oxide/InP interface states
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.330115
Reference13 articles.
1. Analysis and measurement of modal noise in an optical fibre
2. Low leakage nearly ideal Schottky barriers to n-InP
3. Analysis of the oxide/semiconductor interface using Auger and ESCA as applied to InP and GaAs
4. Analysis of the oxide/semiconductor interface using Auger and ESCA as applied to InP and GaAs
5. Thermal oxidation of InP and properties of oxide film
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4. Analysis of interface states and series resistances in Au/p-InP structures prepared with photolithography technique;Indian Journal of Physics;2013-05-09
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