Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3193546
Reference24 articles.
1. Modulation spectroscopy of semiconductors: bulk/thin film, microstructures, surfaces/interfaces and devices
2. New normalization procedure for modulation spectroscopy
3. Sweeping photoreflectance spectroscopy of semiconductors
4. A new offset technique for suppression of spurious signals in photoreflectance spectra
5. A new Fourier transform photo-modulation spectroscopic technique for narrow band-gap materials in the mid- to far-infra-red
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