A new offset technique for suppression of spurious signals in photoreflectance spectra
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144801
Reference14 articles.
1. Modulation spectroscopy of semiconductors: bulk/thin film, microstructures, surfaces/interfaces and devices
2. Photoreflectance study of surface Fermi level in GaAs and GaAlAs
3. In situ photoreflectance study of the effects of sputter/annealing on the Fermi level at (001) n- and p-type GaAs surfaces
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