X‐Ray Diffraction Method for Determining Strain Distributions in Thin Metallic Films with Application to Gold Films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1660655
Reference42 articles.
1. Mechanical Behaviour of Crystals with Twinned Structure
2. Tensile Properties of Thin, Evaporated Gold Films
3. A study of the deformation and fracture of single-crystal gold films of high strength inside an electron microscope
4. Stress in vapor-deposited nickel films
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1. On-Chip Identification and Interaction Analysis of Gel-Resolved Proteins Using a Diamond-like Carbon-Coated Plate;Journal of Proteome Research;2007-05-10
2. An X-ray diffraction (XRD) study of vapor deposited gold thin films on aluminum nitride (A1N) substrates;Thin Solid Films;1997-07
3. Stresses in Thin Films;Advances in X-Ray Analysis;1990
4. Stresses in Thin Films;Advances in X-ray Analysis;1989
5. Effect of defect structure on the electrical conduction mechanism in metallic thin films;Journal of Materials Science;1985-06
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