Effect of ion‐beam sputter damage on Schottky barrier formation in silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.92738
Reference11 articles.
1. Sputtered oxide/indium phosphide junctions and indium phosphide surfaces
2. On resolving the anomaly of indium-tin oxide silicon junctions
3. Electronic properties of Pb1−xHgxSSi heterojunctions
4. The effects of sputtering damage on the characteristics of molybdenum-silicon Schottky barrier diodes
5. The effects of sputtering damage on the characteristics of molybdenum-silicon Schottky barrier diodes
Cited by 145 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Evaluation of gamma-irradiation effects on the electrical properties of Al/(ZnO-PVA)/p-Si type Schottky diodes using current-voltage measurements;Radiation Physics and Chemistry;2021-06
2. Characterization techniques of ion bombardment damage on electronic devices during plasma processing—plasma process-induced damage;Japanese Journal of Applied Physics;2021-03-23
3. The effect of radiation on the forward and reverse bias current–voltage (I–V) characteristics of Au/(Bi4Ti3O12/SiO2)/n-Si (MFIS) structures;Journal of Materials Science: Materials in Electronics;2020-06-22
4. Protection of GaInP2 Photocathodes by Direct Photoelectrodeposition of MoSx Thin Films;ACS Applied Materials & Interfaces;2019-06-18
5. Linear and nonlinear optical properties of irradiated Toluidine Blue thin films;Optik;2019-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3