Grain‐boundary electromigration in thin films II. Tracer measurements in pure Au
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.323336
Reference20 articles.
1. Lateral self-diffusion and electromigration in thin metal films
2. Tracer self‐diffusion and electromigration in thin tin films
3. Electromigration in thin gold films
4. Quantitative measurements of the mass distribution in thin films during electrotransport experiments
5. RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS
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3. Engineering the grain boundary network of thin films via ion-irradiation: Towards improved electromigration resistance;Acta Materialia;2017-01
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