Tracer self‐diffusion and electromigration in thin tin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.322647
Reference31 articles.
1. Electromigration of Ti–Au thin‐film conductors at 180° C
2. RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS
3. Electromigration in thin gold films
4. Grain boundary self-diffusion in evaporated Au films at low temperatures
5. Lateral self-diffusion and electromigration in thin metal films
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