Quantitative and high spatial resolution d33 measurement of piezoelectric bulk and thin films
Author:
Affiliation:
1. Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
2. Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
Funder
Darpa Meso Program
National Security Science and Engineering Fellowship
The Center for Nanoscale Materials Science
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4935140
Reference58 articles.
1. Thin Film Piezoelectrics for MEMS
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4. Domain wall contributions to the properties of piezoelectric thin films
5. Investigating the effects of reduced size on the properties of ferroelectrics
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