Subject
Physics and Astronomy (miscellaneous)
Cited by
14 articles.
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1. ELLIPSOMETRIC CHARACTERIZATION OF THIN FILMS;Handbook of Surfaces and Interfaces of Materials;2001
2. Selected contactless optoelectronic measurements for electronic applications (invited);Review of Scientific Instruments;1998-02
3. Chapter 1 Ellipsometric Analysis;Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization;1997
4. Time-resolved polarimetry on an optical fibre ammeter;Pure and Applied Optics: Journal of the European Optical Society Part A;1996-05
5. Microellipsometry;Microanalysis of Solids;1994