Thickness dependent critical strain in submicron Cu films adherent to polymer substrate
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2722684
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5. L. B. Freund and S. Suresh,Thin Film Materials: Stress, Defect Formation, and Surface Evolution(Cambridge University Press, Cambridge, 2003), p. 86.
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