Dependence of breakdown field on dielectric (interelectrode) thickness in base-metal electroded multilayer capacitors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2713780
Reference8 articles.
1. Electrical Breakdown (DRAMs and NV-RAMs)
2. Electric Breakdown in Ionic Crystals
3. Thickness Influence in Breakdown Phenomena of Thin Dielectric Films
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