Affiliation:
1. Department of Electrical and Computer Engineering, New Jersey Institute of Technology 1 , Newark, New Jersey 07102, USA
2. School of Engineering Technology, Purdue University 2 , West Lafayette, Indiana 47907, USA
Abstract
Metal chalcogenide thin films are used in a wide range of modern technological applications. While vacuum deposition methods are commonly utilized to fabricate the film, solution-based approaches have garnered an increasing interest due to their potential for low-cost, high-throughput manufacturing, and compatibility with silicon complementary metal–oxide–semiconductor processing. Here, we report a general strategy for preparing mid-wavelength infrared (MWIR = 3–5 μm) photoconductive film using a PbSe molecular ink. This ethylenediamine-based ink solution is synthesized using a simple diphenyl dichalcogenide route, and the deposited film, after the sensitization annealing, exhibits a specific detectivity of 109 Jones at 3.5 μm at room temperature. This work represents the demonstration of MWIR-photosensitive semiconductor films prepared using an emerging alkahest-based approach, highlighting a significant research avenue in the pursuit toward low SWAP-C (size, weight, power consumption, and cost) infrared imager development.
Funder
National Science Foundation
Subject
Physics and Astronomy (miscellaneous)
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献